A Statistical Approach to Neural Networks for Pattern Recognition

This book aims to answer questions that arise when statisticians are first confronted with this type of model, such as: How robust is the model to outliers? Could the model be made more robust? Which points will have a high leverage?

Prehľad výstav, na ktorých bol titul prezentovaný:

- VÝSTAVA KNIH v ÚSTŘEDNÍ KNIHOVNĚ VŠCHT 2009
- ENGINEERING & TECHNOLOGY 2009
- SCIENCE 2009
- SCIENTIFIC BOOKS for PROFESSIONALS & STUDENTS 2009
- VEDECKÁ KNIHA _ UMB 2009
- JARNÁ VÝSTAVA ODBORNÝCH KNÍH 2009
- ELECTRICAL ENGINEERING & INFORMATION TECHNOLOGY 2008
- VĚDECKÁ KNIHA 2007 _ TU Liberec
- ELECTRICAL ENGINEERING & INFORMATION TECHNOLOGY 2007