Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Tanaka Nobuo
ISBN: 9781848167896
Vydavateľstvo: World Scientific
Rok vydania: 2014
Väzba: Hardback
Počet strán: 616
Dostupnosť: Na sklade
Pôvodná cena: 175,29 €
Výstavná cena:
157,76 €(t.j. po zľave 10%)
(Cena je uvedená vrátane 10% DPH)
Katalógová cena: 129 GBP
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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.