Značky
1. Autor | Názov titulu | Vydavateľstvo | Rok | Cena | |
---|---|---|---|---|---|
Richard Haight | Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes) | World Scientific | 2011 | 517,22 € | |
Joel M. Haight | Handbook of Loss Prevention Engineering | Wiley | 2013 | 352,58 € |