Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
Manuel Servin, J. Antonio Quiroga, Moises Padilla
ISBN: 9783527411528
Vydavateľstvo: Wiley
Rok vydania: 2014
Väzba: Hardback
Počet strán: 344
Pôvodná cena: 174,02 €
Výstavná cena:
147,92 €(t.j. po zľave 15%)
(Cena je uvedená vrátane 10% DPH)
Katalógová cena: 113 GBP
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This book presents the theoretical principles and practical applications for classical and advanced interferometry in optical–metrology. A major novelty of this work is the use of the Frequency Transfer Function (FTF) and the theory of Stochastic Process in fringe pattern analysis. These mathematical tools better describe the phase demodulation algorithms with desired spectral response, detuning insensitivity, signal–to–noise robustness and harmonic rejection. From the contents: Digital Linear Systems Synchronous Temporal Interferometry Asynchronous Temporal Interferometry Spatial Methods with Carrier Spatial Methods without Carrier Phase Unwrapping List of 40 Phase–Shifting Algorithms