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  1. Autor Názov titulu Vydavateľstvo Rok Cena
Bowen D. X-Ray Metrology in Semiconductor Manufacturing Taylor & Francis 2006 Na vyžiadanie
D.K. Singh Fundamentals of Manufacturing Engineering Taylor & Francis 2008 86,06 €
French College of Metrology Transverse Disciplines in Metrology: Proceedings of the 13th International Metrology Congress Wiley 2009 296,84 €
Horn A. Ultra-fast Material Metrology Wiley 2009 Na vyžiadanie
John K. Taylor,Cheryl Cihon Statistical Techniques for Data Analysis Taylor & Francis 2004 76,20 €
Glaser M. Handbook of Metrology Wiley 2010 Na vyžiadanie
D. Brynn Hibbert Data Analysis for Chemistry, An Introductory Guide for Students and Laboratory Scientists Oxford University Press 2005 Na vyžiadanie
Muammer Koc,Tugrul Ozel Micro–Manufacturing: Design and Manufacturing of Micro–Products Wiley 2011 105,02 €
Richard S. Figliola,Donald E. Beasley Theory and Design for Mechanical Measurements Wiley 2011 222,90 €
Stefan Landis Nano Lithography Wiley 2011 106,19 €
Whitehouse J. D. Handbook of Surface and Nanometrology CRC Press 2010 337,95 €
Valery A. Slaev,Anna G. Chunovkina,Leonid A. Mironovsky Metrology and Theory of Measurement De Gruyter 2013 157,03 €
Naftaly M. Terahertz Metrology Artech House 2014 164,05 €
Paul Seidel Applied Superconductivity: Handbook on Devices and Applications Wiley 2015 504,00 €
Tantra R. Nanomaterial Characterization Wiley 2016 99,92 €
Manuel Servin, J. Antonio Quiroga, Moises Padilla Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications Wiley 2014 147,92 €
Kurt Jacobs Quantum Measurement Theory and its Applications Cambridge University Press 2014 80,39 €