Značky

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  1. Autor Názov titulu Vydavateľstvo Rok Cena
Billington R. Living Philosophy Routledge 2003 Na vyžiadanie
Bowen D. X-Ray Metrology in Semiconductor Manufacturing Taylor & Francis 2006 Na vyžiadanie
Steen J. Rendering with Mental Ray & 3ds Max Focal Press 2007 Na vyžiadanie
Welberry, Thomas Richard Diffuse X-Ray Scattering and Models of Disorder Oxford University Press 2004 130,40 €
Demtroder W. Laser Spectroscopy, Vol. 2 Springer Verlag 2008 Na vyžiadanie
B. B. He Two-dimensional X-ray Diffraction Wiley 2009 Na vyžiadanie
Andrew Boyd,Peter Stewart,Ray Alexander Broadcast Journalism: Techniques of Radio and Television News Taylor & Francis 2008 39,53 €
Chambers, Ray An Introduction to Model-Based Survey Sampling with Applications Oxford University Press 2012 67,05 €
Craig Hoffman Encyclopedia of Optical and Photonic Engineering (Print) - Five Volume Set Taylor & Francis 2015 2 373,41 €
Reinhold Klockenkämper,Alex von Bohlen Total–Reflection X–Ray Fluorescence Analysis and Related Methods Wiley 2015 114,64 €
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