Značky
| 1. Autor | Názov titulu | Vydavateľstvo | Rok | Cena | |
|---|---|---|---|---|---|
| Baum R. | Study Guide to Accompany Logic | Harcourt | 1996 | Na vyžiadanie | |
| Crane A. | Business Ethics | Oxford UP | 2003 | Na vyžiadanie | |
| Huffman F. | Practical IP and Telecom for Broadcast Engineering and Operations | Focal Press | 2004 | Na vyžiadanie | |
| Matejka D. | Plasma Spraying of Metallic and Ceramic Materials | Wiley | 1989 | Na vyžiadanie | |
| McPeake R. | EC Competition Law Practice | Oxford UP | 2004 | Na vyžiadanie | |
| Purtilo R. | Ethical Dimension in the Health Professions | Saunders | 2005 | Na vyžiadanie | |
| Kapadia A. | Mathematical Statistics with Applications | Taylor & Francis | 2005 | Na vyžiadanie | |
| Maciaszek L. | Practical Software Engineering | Addison Wesley | 2005 | Na vyžiadanie | |
| Knudsen S. | Guide to Analysis of DNA Microarray Data | Wiley | 2004 | Na vyžiadanie | |
| Harwood R. | Stroke Care: A Practical Manual | Oxford UP | 2005 | Na vyžiadanie | |
| Heffernan T.M. | A Student's Guide to Studying Psychology | Taylor & Francis | 2005 | Na vyžiadanie | |
| Watson M. | Oxford Handbook of Palliative Care | Oxford UP | 2005 | Na vyžiadanie | |
| Olifer N. | Computer Networks: Principles, Technologies and Protocols for Network Design | Wiley | 2006 | Na vyžiadanie | |
| Ruxton G. | Experimental Design for the Life Science | Oxford UP | 2006 | Na vyžiadanie | |
| Ewen D. | Applied Physics | Pearson | 2005 | Na vyžiadanie | |
| Bowen D. | X-Ray Metrology in Semiconductor Manufacturing | Taylor & Francis | 2006 | Na vyžiadanie | |
| Metiu H. | Physical Chemistry : Statistical Mechanics | Garland Science | 2006 | Na vyžiadanie | |
| Holland G. | Plasma Source Mass Spectrometry: Current Trends and Future Developments | RSC | 2005 | Na vyžiadanie | |
| Dorner J. | Writing for the Internet | Oxford UP | 2002 | Na vyžiadanie | |
| Paul A. | Fundamentals of Paediatric Anaesthesia | Anshan | 2006 | Na vyžiadanie |